ECE 451    SPRING 2017

Section      Time         Instructor                   Room

X               12:00 MW J. Schutt-Aine             3015 ECEB

 

Book

M. Steer, Microwave and RF Design, 2nd Edition, SciTech Publishing, 2013.

Notes

Lab notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/labs.html

Class notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/notes

Grading Policy

Lab                                    55% of total

Homework and Quizzes    20% of total

Midterm                            10% of total

Final                                  15% of total

 

Lab Reports Policy

Instructions for preparing and returning lab reports will be given and are described in the Introduction for the Laboratory Notes.

Homework & Quizzes

Homework assignments will be given throughout the semester. Assignments will be passed on a Wednesday and will be due two weeks later.

Midterm Exam

Monday, March 6, 12:00 – 12:50 pm, 3015 ECEB

Laboratory Instructors (Lab 5076 ECEB)

Maryam Hajimiri - hajimir2@illinois.edu

Thong Nguyen - tnnguye3@illinois.edu

Yixuan Zhao - yzhao60@illinois.edu

Course Web Site

http://emlab.illinois.edu/ece451


ECE 451 SCHEDULE: FALL 2017

 

Lec

Mo

Date

Topic

Ch

Lab(Tuesday & Thursday)

1

JAN

M-23

Introduction

 

 

2

 

W-25

Transmission Lines

5

 

3

 

M-30

Smith Chart

5

Lab 1 – RF Power Detection – LabView introduction

4

FEB

W-1

Planar Transmission Lines

6

 

5

 

F-3

Scattering Parameters

9

 

6

 

M-6

Scattering Parameters of TL

9

Lab 2 – Slotted line

7

 

W-8

Flow Graph

10

 

8

 

F-10

One-term error model

 

 

9

 

M-13

Three-term error Model

 

Lab 3 – Scalar Reflectometry with  LabView

10

 

W-15

Three-term error Model

 

 

11

 

F17

8-12- term error models

 

 

12

 

M-20

TRL Calibration Method

 

Lab 4 – Error Correction

13

 

W-22

Application of TRL

 

 

14

 

F-24

Time-Domain Reflectometry

 

 

15

 

M-27

TL Extraction

 

Lab 5 – PNA and TDR

16

MAR

W-1

On-chip Measurements

 

 

 

 

M-6

Midterm Exam

 

Lab 6 – Extraction of TL Parameters

17

 

W-8

Eye Diagram Measurements

 

 

18

 

M-13

Advanced Techniques & Hilbert T

 

Lab 7 – Wafer Tests and Eye Diagrams

19

 

W-15

Advanced Techniques

 

 

 

 

M-20

SPRING BREAK

 

 

20

 

M-27

Linear Amplifiers

 

Lab 8 – TRL Calibration

21

 

W-29

Gain Compression

4.10

 

22

APR

M-3

Power Amplifiers

19

Lab 9 – Advanced Techniques

23

 

W-5

Power Amplifiers

 

 

24

 

M-10

X-Parameters

 

Lab 10 – Nonlinear VNA Measurements

25

 

W-12

X-Parameters

 

 

26

 

M-17

X-Parameters

 

Lab 11 – Simulating X-Parameters with ADS

27

 

W-19

Signal Integrity

 

 

28

 

M-24

Signal Integrity

 

Lab 12 – X-Parameter Measurements

 

 

W-26

CAEML - No Class

 

 

29

MAY

M-1

Review

 

 

 

 

W-3

Final Exam