ECE 451    SPRING 2023

Section      Time         Instructor                   Room

X               12:00 MW J. Schutt-Aine             3015 ECEB

Instructor

Jose Schutt-Aine, 5042 ECEB, jesa@illinois.edu

Book

M. Steer, Microwave and RF Design, 2nd Edition, SciTech Publishing, 2013.

Notes

Lab notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/labs.html

Class notes can be downloaded from course web site at: http://emlab.illinois.edu/ece451/notes

Grading Policy

Lab                                    35% of total

Homework and Quizzes    20% of total

Midterm                            10% of total

Lab Final                           15% of total

Final                                  20% of total

Lab Reports Policy

Instructions for preparing and returning lab reports will be given and are described in the Introduction for the Laboratory Notes.

Homework

Homework assignments will be given throughout the semester. Assignments will be passed on a Wednesday and will be due two weeks later and should be uploaded into Canvas.

Midterm Exam

Wednesday, March 8, 12:00 – 12:50 pm, 3015 ECEB

Laboratory Instructors (Lab 5076 ECEB)

Juhitha Konduru - juhitha2@illinois.edu

Bobi Shi - bobishi2@illinois.edu

Course Web Site

http://emlab.illinois.edu/ece451


ECE 451 SCHEDULE: SPRING 2023

 

Lec

Mo

Date

Topic

Ch

Lab(Tuesday & Thursday)

1

JAN

W-18

RF Detection

5

 

2

 

F-20

Transmission Lines

5

 

3

 

M-23

Smith Chart

6

 

4

 

W-25

Applications of Smith Chart

5

 

5

 

F-27

Waveguides

6

 

6

 

M-30

Scattering Parameters

9

Lab 1 – Detection of RF Power - Benchview

7

FEB

W-1

Scattering Parameters of TL

9

 

8

 

F-3

Flow Graph

10

 

9

 

M-6

Error Models

 

Lab 2 – Slotted line

10

 

W-8

ABCD Parameters

 

 

11

 

M-13

TRL Calibration Method

 

Lab 3 – Automated Scalar Reflectometry

12

 

W-15

Application of TRL

 

 

13

 

M-20

Time-Domain Reflectometry

 

Lab 4 – Network Analyzer Error Correction

14

 

W-22

TL  Characterization

 

 

15

 

M-27

TL  Characterization

 

Lab 5 – PNA and TDR

16

MAR

W-1

Frequency Dependence of TL

 

 

17

 

M-6

Requirements of Channels

 

Lab 6 – Extraction of TL Parameters

 

 

W-8

MIDTERM EXAM

 

 

 

 

M-13

SPRING BREAK

 

 

18

 

M-20

On-chip Measurements

 

Lab 7 – Wafer Tests and Eye Diagrams

19

 

W-22

Eye Diagram Measurements

 

 

20

 

M-27

Macro-Modeling

 

Lab 8 – TRL Calibration

21

 

W-29

Circuit Synthesis

 

 

22

APR

M-3

Linear Amplifiers

 

Lab 9 – Advanced Techniques

23

 

W-5

Gain Compression

 

 

24

 

M-10

Power Amplifiers

19

Lab 10 – Amplifier Measurements

25

 

W-12

Power Amplifiers

 

 

26

 

M-17

X-Parameters

 

Lab 11 – Generating X Parameters via Simulation

27

 

W-19

X-Parameters

 

 

28

 

M-24

X-Parameters

 

Lab 12 – Measuring X Parameters

29

 

W-26

Signal Integrity

 

 

30

MAY

M-1

Signal Integrity

 

 

 

 

W-3

Final Exam