ECE 451 SPRING 2023
Section Time Instructor Room
X 12:00 MW J. Schutt-Aine 3015 ECEB
Instructor
Jose Schutt-Aine, 5042
ECEB, jesa@illinois.edu
Book
M. Steer, Microwave and RF Design, 2nd
Edition, SciTech Publishing, 2013.
Notes
Lab notes can be downloaded
from course web site at: http://emlab.illinois.edu/ece451/labs.html
Class notes can be
downloaded from course web site at: http://emlab.illinois.edu/ece451/notes
Grading Policy
Lab 35% of total
Homework and Quizzes 20% of total
Midterm 10% of total
Lab Final 15% of total
Final 20% of total
Lab Reports Policy
Instructions for preparing and returning lab reports will be given and are described in the Introduction for the Laboratory Notes.
Homework
Homework assignments will be given throughout the semester. Assignments will be passed on a Wednesday and will be due two weeks later and should be uploaded into Canvas.
Midterm Exam
Wednesday, March 8, 12:00 12:50 pm, 3015 ECEB
Laboratory Instructors (Lab 5076 ECEB)
Juhitha Konduru - juhitha2@illinois.edu
Bobi Shi - bobishi2@illinois.edu
Course Web Site
http://emlab.illinois.edu/ece451
ECE 451 SCHEDULE: SPRING 2023
|
Lec |
Mo |
Date |
Topic |
Ch |
Lab(Tuesday & Thursday) |
|
1 |
JAN |
W-18 |
RF Detection |
5 |
|
|
2 |
|
F-20 |
Transmission Lines |
5 |
|
|
3 |
|
M-23 |
Smith Chart |
6 |
|
|
4 |
|
W-25 |
Applications of Smith Chart |
5 |
|
|
5 |
|
F-27 |
Waveguides |
6 |
|
|
6 |
|
M-30 |
Scattering Parameters |
9 |
Lab 1 Detection of RF
Power - Benchview |
|
7 |
FEB |
W-1 |
Scattering Parameters of TL |
9 |
|
|
8 |
|
F-3 |
Flow Graph |
10 |
|
|
9 |
|
M-6 |
Error Models |
|
Lab 2 Slotted line |
|
10 |
|
W-8 |
ABCD Parameters |
|
|
|
11 |
|
M-13 |
TRL Calibration Method |
|
Lab 3 Automated Scalar
Reflectometry |
|
12 |
|
W-15 |
Application of TRL |
|
|
|
13 |
|
M-20 |
Time-Domain Reflectometry |
|
Lab 4 Network Analyzer
Error Correction |
|
14 |
|
W-22 |
TL Characterization |
|
|
|
15 |
|
M-27 |
TL Characterization |
|
Lab 5 PNA and TDR |
|
16 |
MAR |
W-1 |
Frequency Dependence of TL |
|
|
|
17 |
|
M-6 |
Requirements of Channels |
|
Lab
6 Extraction of TL Parameters |
|
|
|
W-8 |
MIDTERM EXAM |
|
|
|
|
|
M-13 |
SPRING BREAK |
|
|
|
18 |
|
M-20 |
On-chip Measurements |
|
Lab 7 Wafer Tests and Eye
Diagrams |
|
19 |
|
W-22 |
Eye Diagram Measurements |
|
|
|
20 |
|
M-27 |
Macro-Modeling |
|
Lab 8 TRL Calibration |
|
21 |
|
W-29 |
Circuit Synthesis |
|
|
|
22 |
APR |
M-3 |
Linear Amplifiers |
|
Lab 9 Advanced Techniques |
|
23 |
|
W-5 |
Gain Compression |
|
|
|
24 |
|
M-10 |
Power Amplifiers |
19 |
Lab 10 Amplifier Measurements |
|
25 |
|
W-12 |
Power Amplifiers |
|
|
|
26 |
|
M-17 |
X-Parameters |
|
Lab 11 Generating X Parameters via Simulation |
|
27 |
|
W-19 |
X-Parameters |
|
|
|
28 |
|
M-24 |
X-Parameters |
|
Lab 12 Measuring X
Parameters |
|
29 |
|
W-26 |
Signal Integrity |
|
|
|
30 |
MAY |
M-1 |
Signal Integrity |
|
|
|
|
|
W-3 |
Final Exam |
|
|